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“Measure Twice, Cut Once: Assessing Some China–US Technology Connections” Series

The Johns Hopkins University Applied Physics Laboratory commissioned “Measure Twice, Cut Once: Assessing Some China–US Technology Connections,” a series of papers from experts in specific technology areas to explore the advisability and potential consequences of decoupling.

In each of these areas, the authors have explored the feasibility and desirability of increased technological separation and offered their thoughts on a possible path forward. The authors all recognize the real risks presented by aggressive, and frequently illegal, Chinese attempts to achieve superiority in critical technologies. However, the project also represents a reality check regarding the feasibility and potential downsides of broadly severing technology ties with China.

The project was led by former Secretary of the Navy Richard Danzig, initially in partnership with Avril Haines, former Deputy National Security Advisor. This compilation of papers was authored by experts from across the nation, and the views of the authors are their own.